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Friday, April 17, 2020 | History

2 edition of Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces found in the catalog.

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

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  • 24 Currently reading

Published by Springer Science+Business Media, LLC in New York, NY .
Written in English

    Subjects:
  • Physical organic chemistry,
  • Materials,
  • Microreactors

  • Edition Notes

    Statementby Weronika Walkosz
    SeriesSpringer Theses
    ContributionsSpringerLink (Online service)
    The Physical Object
    Format[electronic resource] /
    ID Numbers
    Open LibraryOL25542546M
    ISBN 109781441978165, 9781441978172


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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces by Weronika Walkosz Download PDF EPUB FB2

This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si 3 N 4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF).

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces. Authors The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of Brand: Springer-Verlag New York.

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces (Springer Theses) [Walkosz, Weronika] on *FREE* shipping on qualifying offers. Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces (Springer Theses)Author: Weronika Walkosz.

Get this from a library. Atomic scale characterization and first-principles studies of Si₃N₄ interfaces. [Weronika Walkosz].

Read "Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces" by Weronika Walkosz available from Rakuten Kobo. This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron Brand: Springer New York.

Walkosz W. () Atomic-Resolution Study of β-Si 3 N 4 /SiO 2 Interfaces. In: Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces. In: Atomic Scale Characterization and First-Principles Studies of Si₃N₄ : Weronika Walkosz.

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Alves, A. (et al.) () Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces. Walkosz, W. () Format: eBook, Hardcover, Softcover.

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