2 edition of Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces found in the catalog.
|Statement||by Weronika Walkosz|
|Contributions||SpringerLink (Online service)|
|The Physical Object|
|Format||[electronic resource] /|
|ISBN 10||9781441978165, 9781441978172|
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This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si 3 N 4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF).
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces. Authors The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of Brand: Springer-Verlag New York.
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces (Springer Theses) [Walkosz, Weronika] on *FREE* shipping on qualifying offers. Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces (Springer Theses)Author: Weronika Walkosz.
Get this from a library. Atomic scale characterization and first-principles studies of Si₃N₄ interfaces. [Weronika Walkosz].
Read "Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces" by Weronika Walkosz available from Rakuten Kobo. This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron Brand: Springer New York.
Walkosz W. () Atomic-Resolution Study of β-Si 3 N 4 /SiO 2 Interfaces. In: Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces. In: Atomic Scale Characterization and First-Principles Studies of Si₃N₄ : Weronika Walkosz.
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Alves, A. (et al.) () Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces. Walkosz, W. () Format: eBook, Hardcover, Softcover.
Read "Applied Many-Body Methods in Spectroscopy and Electronic Structure" by available from Rakuten Kobo. There has been a steady advance of the atomic and molecular many-body methodology over the last few years, with a concom Brand: Springer US.
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Journal of the American Chemical Society (23), S. Volltext nicht vorhanden. The Minerals, Metals & Materials Society (TMS) is a member-driven international professional society dedicated to fostering the exchange of learning and ideas across the entire range of materials science and engineering, from minerals processing and primary metals production, to basic research and the advanced applications of materials.
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Various standard characterization techniques and equipment, such as electron microscopy, atomic force microscopy, hardness testing machine, scratch tester, and pin-on-disc machine, were used to analyze and quantify the following properties and parameters: surface morphology, thickness, hardness, adhesion, and coefficient of friction (COF) of.
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